Onto Innovation is a leader in process control, combining global scale with an expanded portfolio of leading-edge technologies that include: 3D metrology spanning the chip from nanometer-scale transistors to micron-level die-interconnects; macro defect inspection of wafers and packages; metal interconnect composition; factory analytics; and lithography for advanced semiconductor packaging. Our breadth of offerings across the entire semiconductor value chain helps our customers solve their most difficult yield, device performance, quality, and reliability issues. Onto Innovation strives to optimize customers’ critical path of progress by making them smarter, faster and more efficient.

Job Summary & Responsibilities

Position Summary

We are seeking a highly motivated R&D Scientist to join our advanced metrology and analytics research team in Singapore. The successful candidate will play an active hands-on role in developing next-generation data analytics and modeling solutions for Critical Dimension Small Angle X-ray Scattering (CD-SAXS) and Optical Critical Dimension (OCD) metrologies.

This role focuses on developing innovative algorithms, physics-based modeling, machine learning approaches, and data fusion methodologies that enable accurate and robust characterization of advanced semiconductor structures. The scientist will collaborate closely with R&D scientists, applications, software engineering, and product / program management to create differentiated metrology solutions for next-generation semiconductor manufacturing.

Roles and Responsibilities:

• Interface with application scientists, product/program management, and marketing team to understand and analyze customers’ requirements and technology gaps.
• Innovate and develop new concepts to address customer challenges and close identified technology gaps, working both independently and within cross‑functional teams.
• Collect and analyze technical data, conduct literature reviews, propose new methodologies or improvements to existing solutions.
• Conceptualize, design, prototype, and fine-tune algorithms and find the best approach to solve a specific problem.
• Develop advanced algorithms for CD-SAXS data analysis, profile reconstruction, and parameter extraction.
• Explore machine learning and AI techniques to enhance model fitting, inversion, and uncertainty quantification.
• Improve measurement accuracy, precision, robustness, and computational efficiency of OCD and CD-SAXS solutions.
• Create data fusion frameworks that leverage complementary information from multiple metrology sources.
• Develop and execute test plans to verify algorithm performance, reliability, and readiness for deployment in production environments.
• Collaborate with product and software engineering teams to transition research concepts into production-ready solutions.
• Publish technical papers, invention disclosures, and patents related to metrology analytics and modeling.

Play a key role in innovative technology development, deliver solutions that create measurable value for customers and business.

Qualifications

Required Qualifications

• Ph.D. or Master’s degree in Chemical Physics, Physics, Applied Physics, Electrical Engineering, Materials Science, Optics, Mathematics, Statistics, Data Science, or a related field.
• Strong background in modeling, data analysis, and scientific computing.
• Experience developing algorithms using Python, MATLAB, C++, or similar programming languages.
• Solid understanding of signal processing, statistical analysis, optimization methods, and inverse problem solving.
• Strong communication skills and ability to work in a multidisciplinary, fast-paced, iterative development environment.
• Demonstrate intellectual honesty and a sense of urgency in driving projects to completion.
• Ability to travel up to 20%.

Preferred Qualifications

• Experience in semiconductor metrology, process control, or computational lithography.
• Knowledge of X-ray scattering techniques including CD-SAXS, XRD, XRR etc., optical metrology technologies including OCD, scatterometry, ellipsometry, or related methods.
• Familiarity with machine learning, Bayesian inference, uncertainty quantification, and data fusion techniques.
• Experience developing physics-informed AI or hybrid modeling approaches.
• Track record of publications, patents, or significant technical contributions in relevant fields.

Success Factors

The ideal candidate will:

• Be passionate about solving challenging semiconductor metrology problems.
• Demonstrate strong analytical and scientific problem-solving skills.
• Thrive in a highly collaborative research environment.
• Balance scientific rigor with practical product impact.
• Drive innovation from early-stage concepts through technology deployment.

Onto Innovation Inc. offers competitive salaries and a generous benefits package, including health/dental/vision/life/disability, PTO, 401K plan with employer match, and an Employee Stock Purchase Program (ESPP) along with health & wellness initiatives. We provide a collaborative working environment along with resources, and state-of-the-art tools & equipment to promote success; and a welcoming, inclusive corporate culture where individuals are recognized for their contributions.

Onto Innovation Inc. is an Equal Opportunity Employer and all qualified applicants will receive consideration for employment without regard to race, color, religion, gender, sexual orientation, national origin, genetic information, age, disability, veteran status, or any other legally protected basis.

For positions requiring access to technical data, Onto Innovation Inc., Inc. may have to obtain export licensing approval from the U.S. Department of Commerce - Bureau of Industry and Security and/or the U.S. Department of State - Directorate of Defense Trade Controls. As such, applicants for this position – except US Citizens, US Permanent Residents, and protected individuals as defined by 8 U.S.C. 1324b(a)(3) – may have to go through an export licensing review process.